General info

Areas of scientific activity (after 1997)

• Investigation of defects and deformations of single-crystal lattices and semiconductor thin layers systems (especially AIII-BV compounds and nitrides)
• Investigation of magnetic structure and interlayer correlations in semiconductor superlattices (EuTe/PbTe, EuS/PbS, EuS/YbSe, GaMnAs/GaAs)

Scientific Staff: 7 persons

Engineers, Technicians: 3 persons

Research methods

• X-ray high resolution diffractometry
• X-ray powder diffractometry
• X-ray section, projection, and plane wave topography
• X-ray reflectometry
• Simulation techniques for reciprocal space maps and topographs
• Elastic and inelastic thermal neutron scattering
• Neutron reflectometry and wide-angle neutron diffraction

Equipment

• X-ray generators (7 pcs)
• X-ray high-resolution multi-crystal diffractometers (3 pcs)
• X-ray powder diffractometer/reflectometer
• X-ray topographic cameras (8 pcs)
• Neutron triple-axis spectrometer

Main scientific achievements (after 1997)

Invited talks (after 1997)

International conferences organized by the Division (after 1997)

• Synchrotron Radiation Studies of Materials, 5th National Symposium of Synchrotron Radiation Users, 31 May-1 June 1999, Warsaw
• 5th European Conference on High Resolution X-ray Diffraction and Topography "XTOP2000", 13-15 September 2000, Jaszowiec-Ustroń

International cooperations (after 1997)

• Oregon State University, USA
• Royal Holloway College, University of London, England
• Synchrotron Laboratory, Daresbury, England
• Hasylab, DESY, Hamburg, Germany
• Armenian State University, Erewan, Armenia
• Technical University, Kharkov, Ukraine
• Johannes-Kepler University, Linz, Austria
• Laboratoire de Minéralogie-Cristallographie de Paris, France

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