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M. Sc. Theses (after 1997)

  1. Joanna Kutner, X-ray study of epitaxial layers of diluted solid-state solutions A1-xXxTe/GaAs, 1997, supervisor: dr M. Szymański
  2. Iwona Małek, X-ray study of a CdTe single crystal doped with In, 1997, supervisor: dr hab. E. Zielińska-Rohozińska
  3. Kinga Trześniewska, A study of defects generated in Si single crystals annealed at high hydrostatic pressure, 1997, supervisor: dr G. Kowalski
  4. Elżbieta Klimkowska, Defects in single crystals of synthetic diamond grown by the reconstitution method at high pressure and temperature, 1998, supervisor: dr G. Kowalski
  5. Ewa Leśkiewicz-Grzanka, A study of structural properties of GaN powder, 1998, supervisor: dr hab. M. Lefeld-Sosnowska
  6. Izabela Mikołajczak, A study of spherical defects in Si single crystals annealed at high hydrostatic pressure, 1998, supervisor: dr hab. M. Lefeld-Sosnowska
  7. Dariusz Młoźniak, X-ray diffraction study of semiconductor epitaxial layers, 1998, supervisor: dr hab. J. Gronkowski
  8. Rafał Mogiliński, Intensity profiles of x-ray section topographs of crystals containing point defects, 1998, supervisor: dr hab. J. Gronkowski
  9. Adam Soborowski, A study of point defects by x-ray high-resolution diffractometry, 1998, supervisor: dr hab. J. Gronkowski
  10. Ilona Frymark, A study of crystal defects by X-ray reflection topography, 1999, supervisor: dr hab. M. Lefeld-Sosnowska
  11. Szymon Grzanka, An X-ray diffraction study of AlGaAs layer structures on GaAs SI and GaAs substrates, 1999, supervisor: dr hab. E. Zielińska-Rohozińska
  12. Sylwia Knieć, Orienting single crystals by X-ray diffractometry, 1999, supervisor: dr hab. E. Zielińska-Rohozińska
  13. Sylwia Kultys, Analysis of neutron and X-ray diffractograms by Rietveld profile method, 1999, supervisor: dr M. Szymański
  14. Małgorzata Regulska, A study of real crystal structure by high resolution X-ray diffractometry, 1999, supervisor: dr hab. M. Lefeld-Sosnowska
  15. Aneta Bilińska, X-ray topography study of synthetic diamonds, 2000, supervisor: dr G. Kowalski
  16. Elżbieta Dadacz, X-ray diffraction from thin CdTe/MnTe superlattices, 2000, supervisor: dr M. Szymański
  17. Zbigniew Grygoruk, A study of microdefects in Si:Ge single crystals, 2000, supervisor: dr hab. M. Lefeld-Sosnowska
  18. Agnieszka Kasztelanic, A study of beryllium single crystal with synchrotron radiation, 2000, supervisor: dr hab. J. Gronkowski
  19. Krzysztof Kuciński, A study of microprecipitates in synthetic diamonds, 2000, supervisor: dr G. Kowalski
  20. Anna Paczuska, X-ray diffractometry measurements of LT-GaAs layers doped with beryllium, 2000, supervisor: dr G. Kowalski
  21. Alina Perzyna, X-ray reflectometry measurements of Langmuir-Blodgett films, 2000, supervisor: dr H. Kępa
  22. Radosław Rzeczkowski, A study of X-ray diffraction from CdTe/MnTe superlattices, 2000, supervisor: dr M. Szymański
  23. Jacek Zborowski, A study of ordered FePt/Pt layers by DAFS, 2000, supervisor: dr hab. J. Gronkowski
  24. Teresa Bednarz, A study of photonic BGO and BSO crystals, 2001, supervisor: dr hab. J. Gronkowski
  25. Aneta Urbańska, Orienting GaAs, GaN and Al2O3 crystals using the back-reflection Laue method and x-ray diffractometry, 2001, supervisor: dr hab. E. Zielińska-Rohozińska
  26. Krzysztof Golachowski, Acquisition of diffuse-scattering intensity maps using a two-reflection monochromator and an analyser, 2002, supervisor: dr hab. J. Gronkowski
  27. Aneta Jeziorska, X-ray structural study of layers of low-temperature gallium arsenide doped with beryllium, 2002, supervisor: dr hab. G. Kowalski
  28. Małgorzata Majer, Characterization of layers of group-3 nitrides by high-resolution x-ray diffractometry, 2002, supervisor: dr hab. E. Zielińska-Rohozińska
  29. Agnieszka Malinowska, A structural study of gallium nitride powders with x-ray diffractometry, 2002, supervisor: dr hab. M. Lefeld-Sosnowska
  30. Edyta Olszyńska, A real-structure study of gadolinum-calcium oxoborates single crystals, 2002, supervisor: dr hab. M. Lefeld-Sosnowska
  31. Sylwia Pachocka, Reflectometric measurements of semiconductor CdTe and MnTe superlattices, 2002, supervisor: dr M. Szymański
  32. Magdalena Rzeszot, An x-ray diffraction study of stresses in the substrate caused by an epitaxial layer in AIII-BV heterostructures, 2003, supervisor: dr hab. E. Zielińska-Rohozińska

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